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Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging

dc.contributor.authorSchulze, Andreas
dc.contributor.authorHan, Han
dc.contributor.authorStrykos, Libor
dc.contributor.authorVystavel, Thomas
dc.contributor.authorPorret, Clément
dc.contributor.authorLoo, Roger
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-10-26T03:32:03Z
dc.date.available2021-10-26T03:32:03Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31748
dc.sourceIIOimport
dc.titleAscertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging
dc.typeMeeting abstract
dc.contributor.imecauthorHan, Han
dc.contributor.imecauthorPorret, Clément
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecHan, Han::0000-0003-2169-8332
dc.contributor.orcidimecPorret, Clément::0000-0002-4561-348X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewyes
dc.source.beginpage1069
dc.source.conferenceECS AiMES 2018 Meeting
dc.source.conferencedate30/09/2018
dc.source.conferencelocationCancun Mexico
dc.identifier.urlhttp://ma.ecsdl.org/content/MA2018-02/31/1069.abstract
imec.availabilityPublished - imec
imec.internalnotesECS Meeting Abstracts; Vol. MA


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