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Conference contributions
Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging
Publication:
Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging
Date
2018
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schulze, Andreas
;
Han, Han
;
Strykos, Libor
;
Vystavel, Thomas
;
Porret, Clément
;
Loo, Roger
;
Caymax, Matty
Journal
Abstract
Description
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2057
since deposited on 2021-10-26
438
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Acq. date: 2025-10-25
Citations
Metrics
Views
2057
since deposited on 2021-10-26
438
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations