Browsing by author "Han, Han"
Now showing items 1-20 of 20
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Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations
Han, Han; Hantschel, Thomas; Strakos, Libor; Vystavel, Tomas; Baryshnikova, Marina; Mols, Yves; Kunert, Bernardette; Langer, Robert; Vandervorst, Wilfried; Caymax, Matty (2020) -
Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling constrast imaging
Schulze, Andreas; Han, Han; Strakos, Libor; Vystavel, Tomas; Porret, Clément; Loo, Roger; Caymax, Matty (2018) -
Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging
Schulze, Andreas; Han, Han; Strykos, Libor; Vystavel, Thomas; Porret, Clément; Loo, Roger; Caymax, Matty (2018) -
Compressively strained epitaxial Ge layers for quantum computing applications
Shimura, Yosuke; Godfrin, Clement; Hikavyy, Andriy; Li, Roy; Aguilera, Juan; Katsaros, Georgios; Favia, Paola; Han, Han; Wan, Danny; De Greve, Kristiaan; Loo, Roger (2024) -
Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques
Minj, Albert; Geens, Karen; Liang, Hu; Han, Han; Noel, Celine; Bakeroot, Benoit; Paredis, Kristof; Zhao, Ming; Hantschel, Thomas; Decoutere, Stefaan (2023) -
Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
Han, Han; Strakos, Libor; Hantschel, Thomas; Vystavel, Tomas; Porret, Clément; Loo, Roger; Caymax, Matty (2021) -
Development and analysis of thick GaN drift layers on 200 mm CTE-matched substrate for vertical device processing
Filho Goncalez, Walter; Borga, Matteo; Geens, Karen; Cingu, Deepthi; Chatterjee, Urmimala; Banerjee, Sourish; Vohra, Anurag; Han, Han; Minj, Albert; Hahn, Herwig; Marx, Matthias; Fahle, Dirk; Bakeroot, Benoit; Decoutere, Stefaan (2023) -
Electrochemical performances of Li-rich Mn-based layered structure cathodes optimized by compositional design
Liu, Leilei; Su, Guobiao; Cheng, Xu; Han, Han; Qiang, Wenjiang; Huang, Bingxin (2022-07-18) -
Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance Nanoelectronics
Shi, Yuanyuan; Groven, Benjamin; Serron, Jill; Wu, Xiangyu; Nalin Mehta, Ankit; Minj, Albert; Sergeant, Stefanie; Han, Han; Asselberghs, Inge; Lin, Dennis; Brems, Steven; Huyghebaert, Cedric; Morin, Pierre; Radu, Iuliana; Caymax, Matty (2021) -
Enhancing the defect contrast in ECCI through angular filtering of BSEs
Han, Han; Hantschel, Thomas; Schulze, Andreas; Strakos, Libor; Vystavel, Tomas; Loo, Roger; Kunert, Bernardette; Langer, Robert; Vandervorst, Wilfried; Caymax, Matty (2020) -
Epitaxial Ge-on-Nothing and Epitaxial Ge on Si-on-Nothing as Virtual Substrates for 3D Device Stacking Technologies
Loo, Roger; Porret, Clément; Han, Han; Srinivasan, Ashwyn; Vecchio, Emma; Depauw, Valerie (2021) -
Epitaxial Ge-on-nothing virtual substrates for 3D device stacking technologies
Loo, Roger; Porret, Clément; Han, Han; Depauw, Valerie (2020-09) -
Epitaxial Ge-on-nothing virtual substrates for 3D device stacking technologies
Loo, Roger; Porret, Clément; Han, Han; Depauw, Valerie (2020-07) -
Extended carrier lifetime in epitaxial Ge-on-Nothing virtual substrates
Porret, Clément; Depauw, Valerie; Han, Han; Srinivasan, Ashwyn; Loo, Roger (2021) -
InAlGaAs encapsulation of MOVPE-grown InAs quantum dots on InP(001) substrate
Hasan, Samiul; Han, Han; Korytov, Maxim; Pantouvaki, Marianna; Van Campenhout, Joris; Merckling, Clement; Vandervorst, Wilfried (2020) -
Nano-ridge engineering of GaSb for the integration of InAs/GaSb heterostructures on 300 mm (001) Si
Baryshnikova, Marina; Mols, Yves; Ishii, Yoshiyuki; Alcotte, Reynald; Han, Han; Hantschel, Thomas; Richard, Olivier; Pantouvaki, Marianna; Van Campenhout, Joris; Van Thourhout, Dries; Langer, Robert; Kunert, Bernardette (2020) -
Observation of the stacking faults in In.53Ga.47As by electron channeling contrast imaging
Hsu, Brent; Han, Han; Simoen, Eddy; Merckling, Clement; Eneman, Geert; Mols, Yves; Collaert, Nadine; Heyns, Marc (2019) -
The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As
Hsu, Brent; Simoen, Eddy; Merckling, Clement; Eneman, Geert; Mols, Yves; Han, Han; Alian, AliReza; Collaert, Nadine; Heyns, Marc (2019) -
The sapphire surface structure and its impact on MOCVD grown wafer-scale MoS2 uniformity and MOSFET variability
Shi, Yuanyuan; Groven, Benjamin; Serron, Jill; Han, Han; Banerjee, Sreetama; Wu, Xiangyu; Ludwig, Jonathan; Asselberghs, Inge; Lin, Dennis; Morin, Pierre; Caymax, Matty; Radu, Iuliana (2019) -
Wafer-scale Ge epitaxial foils grown at high growth rates and released from porous substrates for triple-junction solar cells
Depauw, Valerie; Porret, Clément; Moelants, Myriam; Vecchio, Emma; Kennes, Koen; Han, Han; Loo, Roger; Cho, Jinyoun; Courtois, Guillaume; Kurstjens, Rufi; Dessein, Kristof; Orejuela, Victor; Sanchez-Perez, Clara; Rey-Stolle, Ignacio; Garcia, Ivan (2023)