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The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As
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Authors
Hsu, Brent
;
Simoen, Eddy
;
Merckling, Clement
;
Eneman, Geert
;
Mols, Yves
;
Han, Han
;
Alian, AliReza
;
Collaert, Nadine
;
Heyns, Marc
ISSN
0022-3727
Issue
48
Journal
Journal of Physics D: Applied Physics
Volume
52
Title
The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As
Publication type
Journal article
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