Authors

Stockman, Arno; Masin, Fabrizio; Meneghini, Matteo; Zanoni, Enrico; Meneghesso, Gaudenzio; Bakeroot, Benoit; Moens, Peter

ISSN

0018-9383

Issue

12

Journal

IEEE Transactions on Electron Devices

Volume

65

Title

Gate conduction mechanisms and lifetime modeling of p-gate AlGaN/GaN high-electron-mobility transistors

Publication type

Journal article

Embargo date

9999-12-31