Regular and inverted operating regimes in TiN/a-Si/TiOx/TiN RRAM devices

View/open

36770.pdf (708.2Kb)

Metadata

Show full item record

Authors

Subhechha, Subhali; Degraeve, Robin; Roussel, Philippe; Goux, Ludovic; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Kar, Gouri Sankar

ISSN

0741-3106

Issue

3

Journal

IEEE Electron Device Letters

Volume

39

Title

Regular and inverted operating regimes in TiN/a-Si/TiOx/TiN RRAM devices

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles