Authors

Vaisman Chasin, Adrian; Bury, Erik; Franco, Jacopo; Kaczer, Ben; Rzepa, Gerhard; Putcha, Vamsi; Weckx, Pieter; Ritzenthaler, Romain; Mertens, Hans; Horiguchi, Naoto; Linten, Dimitri

Conference

Taiwan ESD and Reliability Conference (TESDC-2018)

Title

Reliability in stacked Gate-All-Around Si nanowire devices: time dependent variability and full degradation mapping

Publication type

Proceedings paper