Publication:
Reliability in stacked Gate-All-Around Si nanowire devices: time dependent variability and full degradation mapping
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1834 since deposited on 2021-10-26
1last month
Acq. date: 2026-02-24
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Statistics
Views
1834 since deposited on 2021-10-26
1last month
Acq. date: 2026-02-24
Citations