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Automatic generation of in-circuit tests for board assembly defects

dc.contributor.authorvan Schaaijk, Harm
dc.contributor.authorSpierings, Martien
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-26T07:27:42Z
dc.date.available2021-10-26T07:27:42Z
dc.date.issued2018-08
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32105
dc.sourceIIOimport
dc.titleAutomatic generation of in-circuit tests for board assembly defects
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceIEEE International Test Conference Asia - ITC-Asia
dc.source.conferencedate14/08/2018
dc.source.conferencelocationHarbin China
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8462941/
imec.availabilityPublished - imec


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