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Effectiveness of hamming single error correction codes under harsh eectromagnetic disturbances

dc.contributor.authorVan Waes, Jonas
dc.contributor.authorLannoo, Jonas
dc.contributor.authorVankeirsbilck, Jens
dc.contributor.authorDegraeve, Andy
dc.contributor.authorPeuteman, Joan
dc.contributor.authorVanoost, Dries
dc.contributor.authorPissoort, Davy
dc.contributor.authorBoydens, Jeroen
dc.date.accessioned2021-10-26T07:34:57Z
dc.date.available2021-10-26T07:34:57Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32116
dc.sourceIIOimport
dc.titleEffectiveness of hamming single error correction codes under harsh eectromagnetic disturbances
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceEMC Europe 2018, IEEE International Symposium on Electromagnetic Compatibility
dc.source.conferencedate26/08/2018
dc.source.conferencelocationAmsterdam The Netherlands
dc.identifier.urlhttps://doi.org/10.1109/EMCEurope.2018.8485176
imec.availabilityPublished - open access


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