dc.contributor.author | Zhou, Longda | |
dc.contributor.author | Tang, Bo | |
dc.contributor.author | Yang, Ho | |
dc.contributor.author | Xu, Hao | |
dc.contributor.author | Li, Yongliang | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Yin, Huaxiang | |
dc.contributor.author | Zhu, Huilong | |
dc.contributor.author | Zhao, Chao | |
dc.contributor.author | Wang, Wenwu | |
dc.contributor.author | Chen, Dapeng | |
dc.contributor.author | Ye, Tianchun | |
dc.date.accessioned | 2021-10-26T10:50:29Z | |
dc.date.available | 2021-10-26T10:50:29Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32383 | |
dc.source | IIOimport | |
dc.title | Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Xu, Hao | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 6 | |
dc.source.conference | IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA | |
dc.source.conferencedate | 16/07/2018 | |
dc.source.conferencelocation | Singapore Singapore | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8452559 | |
imec.availability | Published - imec | |