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Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices

dc.contributor.authorBastos, Joao
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVerreck, Devin
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorDegraeve, Robin
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorFurnemont, Arnaud
dc.date.accessioned2021-10-27T07:30:12Z
dc.date.available2021-10-27T07:30:12Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32498
dc.sourceIIOimport
dc.titleApplication of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices
dc.typeProceedings paper
dc.contributor.imecauthorBastos, Joao
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.orcidimecBastos, Joao::0000-0002-8877-9850
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.source.peerreviewyes
dc.source.conferenceInternational Integrated Reliability Workshop - IIRW
dc.source.conferencedate13/10/2019
dc.source.conferencelocationFallen Leaf Lake USA
imec.availabilityPublished - imec


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