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Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon

dc.contributor.authorRotondaro, Antonio
dc.contributor.authorHurd, Trace
dc.contributor.authorMertens, Paul
dc.contributor.authorSchmidt, Harald
dc.contributor.authorHeyns, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorVegh, Gerzson
dc.contributor.authorClaeys, Cor
dc.contributor.authorGräf, D.
dc.date.accessioned2021-09-29T12:46:30Z
dc.date.available2021-09-29T12:46:30Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/324
dc.sourceIIOimport
dc.titleLimitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
dc.typeMeeting abstract
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage625
dc.source.conference186th Electrochemical Society Fall Meeting: Symposium on High Purity Silicon III
dc.source.conferencedate9/10/1994
dc.source.conferencelocationMiami, FL USA
imec.availabilityPublished - open access
imec.internalnotesAbstract 406


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