Authors

Bury, Erik; Vaisman Chasin, Adrian; Chuang, Kent; Vandemaele, Michiel; Van Beek, Simon; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri

Conference

2019 IEEE International Reliability Physics Symposium (IRPS)

Title

Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space

Publication type

Proceedings paper

Embargo date

9999-12-31