Publication:
Analysis of electromigration failure of nano-interconnects through a combination of modeling and experimental methods
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2050 since deposited on 2021-10-27
4last month
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Acq. date: 2026-08-06
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Statistics
Views
2050 since deposited on 2021-10-27
4last month
1last week
Acq. date: 2026-08-06
Citations