Electron transport response de-embedding for high-speed image sensors

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Authors
Chang, Yun Tzu; Van Dorpe, Pol; Van Hoof, Chris; Suss, Andreas
Conference
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Title
Electron transport response de-embedding for high-speed image sensors
Publication type
Proceedings paper
Embargo date
9999-12-31
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