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Electron transport response de-embedding for high-speed image sensors

dc.contributor.authorChang, Yun Tzu
dc.contributor.authorVan Dorpe, Pol
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorSuss, Andreas
dc.date.accessioned2021-10-27T07:57:58Z
dc.date.available2021-10-27T07:57:58Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32686
dc.sourceIIOimport
dc.titleElectron transport response de-embedding for high-speed image sensors
dc.typeProceedings paper
dc.contributor.imecauthorChang, Yun Tzu
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1098015
dc.source.conferenceImage Sensing Technologies: Materials, Devices, Systems, and Applications VI
dc.source.conferencedate14/04/2019
dc.source.conferencelocationBaltimore, MD USA
dc.identifier.urlhttps://doi.org/10.1117/12.2518208
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 10980


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