Authors

Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri; Mertens, Hans; Mocuta, Anda; Horiguchi, Naoto

ISSN

1530-4388

Issue

1

Journal

IEEE Transactions on Device and Materials Reliability

Volume

19

Title

ESD protection diodes in bulk Si gate-all- around vertically stacked horizontal nanowire technology

Publication type

Journal article