Publication:

Transient overshoot of sub-10nm bulk FinFET ESD diodes with S/D epitaxy stressor

Date

2019
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

41086.pdf 681.78 KB

Author(s)

Chen, Shih-Hung  
;
Linten, Dimitri  
;
Hellings, Geert  
;
Simicic, Marko  
;
Chiarella, Thomas  
;
Eyben, Pierre  
;
Kubicek, Stefan  
;
Rosseel, Erik  
;
Hikavyy, Andriy  
;
Horiguchi, Naoto  

Journal

Abstract

Description

Statistics

Downloads

1 since deposited on 2021-10-27
Acq. date: 2026-10-08

Views

1903 since deposited on 2021-10-27
1last month
Acq. date: 2026-10-08

Citations

Statistics

Downloads

1 since deposited on 2021-10-27
Acq. date: 2026-10-08

Views

1903 since deposited on 2021-10-27
1last month
Acq. date: 2026-10-08

Citations