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A fully automatic electro-optical test system enabling the development of a silicon photonic technology platform

dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorMagdziak, Rafal
dc.contributor.authorDe Heyn, Peter
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorAbsil, Philippe
dc.contributor.authorRishavy, Dan
dc.contributor.authorFrankel, Joe
dc.contributor.authorKekahuna, Kainoa
dc.contributor.authorNegishi, Kazuki
dc.contributor.authorSimmons, Mike
dc.contributor.authorChristenson, Eric
dc.date.accessioned2021-10-27T08:23:47Z
dc.date.available2021-10-27T08:23:47Z
dc.date.issued2019-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32798
dc.sourceIIOimport
dc.titleA fully automatic electro-optical test system enabling the development of a silicon photonic technology platform
dc.typeProceedings paper
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorMagdziak, Rafal
dc.contributor.imecauthorDe Heyn, Peter
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.orcidimecDe Heyn, Peter::0000-0003-3523-7377
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.source.peerreviewyes
dc.source.conferenceSemiconductor Wafer Test Workshop (SWTW)
dc.source.conferencedate3/06/2019
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttps://www.swtest.org/swtw_library/2019proc/PDF/S04_03_Coster+Rishavy_SWTest_2019.pdf
imec.availabilityPublished - imec


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