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A Bayesian approach to adaptive frequency sampling

dc.contributor.authorDe Ridder, Simon
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorSpina, Domenico
dc.contributor.authorDhaene, Tom
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-27T08:31:00Z
dc.date.available2021-10-27T08:31:00Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32826
dc.sourceIIOimport
dc.titleA Bayesian approach to adaptive frequency sampling
dc.typeProceedings paper
dc.contributor.imecauthorDe Ridder, Simon
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceSPI2019, IEEE 23th Workshop on Signal and Power Integrity
dc.source.conferencedate18/06/2019
dc.source.conferencelocationChamberry France
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8781640
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-8342-2


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