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Atom column detection from STEM images using the maximum a posteriori probability rule

dc.contributor.authorFatermans, J.
dc.contributor.authorden Dekker, A.J.
dc.contributor.authorO'Leary, C.M.
dc.contributor.authorNellist, P.D.
dc.contributor.authorVan Aert, S.
dc.date.accessioned2021-10-27T09:08:57Z
dc.date.available2021-10-27T09:08:57Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32950
dc.sourceIIOimport
dc.titleAtom column detection from STEM images using the maximum a posteriori probability rule
dc.typeMeeting abstract
dc.source.peerreviewyes
dc.source.conferenceMicroscopy Conference 2019
dc.source.conferencedate1/09/2019
dc.source.conferencelocationBerlin Germany
dc.identifier.urlhttps://visielab.uantwerpen.be/publications/atom-column-detection-stem-images-using-maximum-posteriori-probability-rule
imec.availabilityPublished - imec


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