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Device-aware test: A new test approach towards DPPB

dc.contributor.authorFieback, Moritz
dc.contributor.authorWu, Lizhou
dc.contributor.authorCardoso Medeiros, Guilherme
dc.contributor.authorAziza, Hassen
dc.contributor.authorRao, Siddharth
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.date.accessioned2021-10-27T09:13:21Z
dc.date.available2021-10-27T09:13:21Z
dc.date.issued2019-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32963
dc.sourceIIOimport
dc.titleDevice-aware test: A new test approach towards DPPB
dc.typeProceedings paper
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage10
dc.source.conferenceIEEE International Test Conference (ITC) 2019
dc.source.conferencedate12/11/2019
dc.source.conferencelocationWashington DC USA
imec.availabilityPublished - imec


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