Authors

Franco, Jacopo; Wu, Zhicheng; Rzepa, Gerhard; Ragnarsson, Lars-Ake; Dekkers, Harold; Vandooren, Anne; Groeseneken, Guido; Horiguchi, Naoto; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben

ISSN

1530-4388

Issue

2

Journal

IEEE Transactions on Device and Materials Reliability

Volume

19

Title

On the impact of the gate work-function metal on the charge trapping component of NBTI and PBTI

Publication type

Journal article

Embargo date

9999-12-31