Publication:

On the impact of the gate work-function metal on the charge trapping component of NBTI and PBTI

Date

2019

Journal article

Simple item page Full metadata Statistics

Files

44631.pdf 1.66 MB

Author(s)

;

;

;

Ragnarsson, Lars-Ake

;

Dekkers, Harold

;

Vandooren, Anne

;

Groeseneken, Guido

;

Horiguchi, Naoto

;

Collaert, Nadine

;

Linten, Dimitri

;

;

Journal

IEEE Transactions on Device and Materials Reliability

Statistics

1892 since deposited on 2021-10-27

Acq. date: 2026-04-06