dc.contributor.author | Gao, Zhan | |
dc.contributor.author | Hu, Min-Chun | |
dc.contributor.author | Baert, Rogier | |
dc.contributor.author | Chehab, Bilal | |
dc.contributor.author | Malagi, Santosh | |
dc.contributor.author | Swenton, Joe | |
dc.contributor.author | Huisken, Jos | |
dc.contributor.author | Goossens, Kees | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.date.accessioned | 2021-10-27T09:29:01Z | |
dc.date.available | 2021-10-27T09:29:01Z | |
dc.date.issued | 2019-11 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33007 | |
dc.source | IIOimport | |
dc.title | Application of cell-aware test on an advanced 3nm CMOS technology library | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Gao, Zhan | |
dc.contributor.imecauthor | Baert, Rogier | |
dc.contributor.imecauthor | Chehab, Bilal | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 6 | |
dc.source.conference | IEEE International Test Conference (ITC'19) | |
dc.source.conferencedate | 12/11/2019 | |
dc.source.conferencelocation | Washington DC USA | |
imec.availability | Published - imec | |