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Conference contributions
Deep learning nanometrology of line edge roughness
Publication:
Deep learning nanometrology of line edge roughness
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Date
2019
Proceedings Paper
https://doi.org/10.1117/12.2520941
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44029.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Giannatou, Eva
;
Constantoudis, Vassilios
;
Papavieros, George
;
Papageorgiou, Harris
;
Rutigliani, Vito
;
Lorusso, Gian
;
Van Roey, Frieda
;
Gogolides, Evangelos
Journal
Proceedings of SPIE
Abstract
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2002
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Acq. date: 2025-12-10
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Metrics
Views
2002
since deposited on 2021-10-27
2
last month
2
last week
Acq. date: 2025-12-10
Citations