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Impact of the generation width on the lifetime extraction in Cz silicon p-n junctions

dc.contributor.authorCzerwinski, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorPoyai, Amporn
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-06T10:51:26Z
dc.date.available2021-10-06T10:51:26Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3326
dc.sourceIIOimport
dc.titleImpact of the generation width on the lifetime extraction in Cz silicon p-n junctions
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage88
dc.source.endpage99
dc.source.conferenceDefects in Silicon III
dc.source.conferencedate02/05/1999
dc.source.conferencelocationSeattle, WA USA
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; Vol. 99-1


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