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Physico chemical aspects of hydrogen peroxide based silicon wafer cleaning solutions

dc.contributor.authorSchmidt, Harald
dc.contributor.authorMeuris, Marc
dc.contributor.authorMertens, Paul
dc.contributor.authorRotondaro, Antonio
dc.contributor.authorHeyns, Marc
dc.contributor.authorHurd, Trace
dc.contributor.authorHatcher, Z.
dc.date.accessioned2021-09-29T12:46:52Z
dc.date.available2021-09-29T12:46:52Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/333
dc.sourceIIOimport
dc.titlePhysico chemical aspects of hydrogen peroxide based silicon wafer cleaning solutions
dc.typeProceedings paper
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage259
dc.source.endpage266
dc.source.conferenceProceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
dc.source.conferencedate19/09/1994
dc.source.conferencelocationBrugge belgium
imec.availabilityPublished - open access


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