Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI

View/open

39041.pdf (3.523Mb)

Metadata

Show full item record

Authors

Li, Xiangdong; Zhao, Ming; Bakeroot, Benoit; Geens, Karen; Guo, Weiming; Lempinen, Vesa-Pekka; Sormunen, Jaakko; Groeseneken, Guido; Decoutere, Stefaan

ISSN

0018-9383

Issue

1

Journal

IEEE Transactions on Electron Devices

Volume

66

Title

Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles