Publication:

Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI

Date

2019

Journal article

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Files

39041.pdf 3.52 MB

Author(s)

;

;

Bakeroot, Benoit

;

;

;

Lempinen, Vesa-Pekka

;

Sormunen, Jaakko

;

Groeseneken, Guido

;

Decoutere, Stefaan

Journal

IEEE Transactions on Electron Devices

Statistics

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Acq. date: 2026-08-08