Unveiling the ferroelectric behavior of HfO2 thin films using fast DualEELS analysis

No Thumbnail [100%x80]
Metadata
Show full item record
Authors
Longo, Paolo; Favia, Paola; Popovici, Mihaela Ioana; Vermeulen, Bart; Spillane, Liam; Twesten, Ray
ISSN
1431-9276
Issue
S2
Journal
Microscopy and Microanalysis
Volume
25
Title
Unveiling the ferroelectric behavior of HfO2 thin films using fast DualEELS analysis
Publication type
Journal article
Collections