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Epitaxial growth of (Si)GeSn source/drain layers for advanced gate all around devices
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Authors
Loo, Roger
;
Vohra, Anurag
;
Porret, Clément
;
Hikavyy, Andriy
;
Rosseel, Erik
;
Schaekers, Marc
;
Capogreco, Elena
;
Shimura, Yosuke
;
Kohen, David
;
Tolle, John
;
Vandervorst, Wilfried
Conference
2019 Compound Semiconductor Week (CSW)
Title
Epitaxial growth of (Si)GeSn source/drain layers for advanced gate all around devices
Publication type
Meeting abstract
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