Authors

Makarov, Alexander; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Vandemaele, Michiel; Hellings, Geert; El-Sayed, Al-Moatasem; Jech, Markus; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav

Conference

ESSDERC 2019 - 49th European Solid-State Device Research Conference

Title

Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants

Publication type

Proceedings paper

Embargo date

9999-12-31