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Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants

dc.contributor.authorMakarov, Alexander
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorHellings, Geert
dc.contributor.authorEl-Sayed, Al-Moatasem
dc.contributor.authorJech, Markus
dc.contributor.authorGrasser, Tibor
dc.contributor.authorLinten, Dimitri
dc.contributor.authorTyaginov, Stanislav
dc.date.accessioned2021-10-27T13:17:45Z
dc.date.available2021-10-27T13:17:45Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33512
dc.sourceIIOimport
dc.titleStochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage262
dc.source.endpage265
dc.source.conferenceESSDERC 2019 - 49th European Solid-State Device Research Conference
dc.source.conferencedate23/09/2019
dc.source.conferencelocationCracow Poland
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8901721
imec.availabilityPublished - open access


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