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On correlation between hot-carrier stress induced device parameter degradation and time-zero variability
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Authors
Makarov, Alexander
;
Roussel, Philippe
;
Bury, Erik
;
Vandemaele, Michiel
;
Spessot, Alessio
;
Linten, Dimitri
;
Kaczer, Ben
;
Tyaginov, Stanislav
Conference
International Integrated Reliability Workshop 2019 - IIRW
Title
On correlation between hot-carrier stress induced device parameter degradation and time-zero variability
Publication type
Proceedings paper
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