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1/f noise in fully integrated electrolytically gated FinFETs with fin width down to 20nm

dc.contributor.authorMartens, Koen
dc.contributor.authorDu Bois, Bert
dc.contributor.authorVan Roy, Wim
dc.contributor.authorSeveri, Simone
dc.contributor.authorSiew, Yong Kong
dc.contributor.authorGupta, Anshul
dc.contributor.authorDupuy, Emmanuel
dc.contributor.authorRadisic, Dunja
dc.contributor.authorAltamirano Sanchez, Efrain
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-27T13:39:36Z
dc.date.available2021-10-27T13:39:36Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33552
dc.sourceIIOimport
dc.title1/f noise in fully integrated electrolytically gated FinFETs with fin width down to 20nm
dc.typeMeeting abstract
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorDu Bois, Bert
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorSiew, Yong Kong
dc.contributor.imecauthorGupta, Anshul
dc.contributor.imecauthorDupuy, Emmanuel
dc.contributor.imecauthorRadisic, Dunja
dc.contributor.imecauthorAltamirano Sanchez, Efrain
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecDu Bois, Bert::0000-0003-0147-1296
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.contributor.orcidimecDupuy, Emmanuel::0000-0003-3341-1618
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage66
dc.source.endpage68
dc.source.conferenceICNF conference
dc.source.conferencedate18/01/2019
dc.source.conferencelocationNeuchatel Switzerland
dc.identifier.urlhttps://infoscience.epfl.ch/record/269192
imec.availabilityPublished - imec


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