1/f noise in fully integrated electrolytically gated FinFETs with fin width down to 20nm

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Authors
Martens, Koen; Du Bois, Bert; Van Roy, Wim; Severi, Simone; Siew, Yong Kong; Gupta, Anshul; Dupuy, Emmanuel; Radisic, Dunja; Altamirano Sanchez, Efrain; Simoen, Eddy
Conference
ICNF conference
Title
1/f noise in fully integrated electrolytically gated FinFETs with fin width down to 20nm
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Meeting abstract
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