Publication:

1/f noise in fully integrated electrolytically gated FinFETs with fin width down to 20nm

Date

2019
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Author(s)

Martens, Koen  
;
Du Bois, Bert  
;
Van Roy, Wim  
;
Severi, Simone  
;
Siew, Yong Kong  
;
Gupta, Anshul  
;
Dupuy, Emmanuel  
;
Radisic, Dunja  
;
Altamirano Sanchez, Efrain  
;
Simoen, Eddy  

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2170 since deposited on 2021-10-27
Acq. date: 2025-10-23

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2170 since deposited on 2021-10-27
Acq. date: 2025-10-23

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