Publication:
Variation-aware physics-based electromigration modeling and experimental calibration for VLSI interconnects
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2007 since deposited on 2021-10-27
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Acq. date: 2026-02-27
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Statistics
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2007 since deposited on 2021-10-27
3last month
2last week
Acq. date: 2026-02-27
Citations