Authors

Mohanachandran Nair, Sarath; Bishnoi, Rajendra; B. Tahoori, Mehdi; Zahedmanesh, Houman; Croes, Kristof; Garello, Kevin; Catthoor, Francky

Conference

2019 IEEE International Reliability Physics Symposium (IRPS)

Title

Variation-aware physics-based electromigration modeling and experimental calibration for VLSI interconnects

Publication type

Proceedings paper

Embargo date

9999-12-31