dc.contributor.author | Mohanachandran Nair, Sarath | |
dc.contributor.author | Bishnoi, Rajendra | |
dc.contributor.author | B. Tahoori, Mehdi | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Garello, Kevin | |
dc.contributor.author | Catthoor, Francky | |
dc.date.accessioned | 2021-10-27T14:11:00Z | |
dc.date.available | 2021-10-27T14:11:00Z | |
dc.date.issued | 2019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33608 | |
dc.source | IIOimport | |
dc.title | Variation-aware physics-based electromigration modeling and experimental calibration for VLSI interconnects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Garello, Kevin | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 6 | |
dc.source.conference | 2019 IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | 31/03/2019 | |
dc.source.conferencelocation | Monterey, CA USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8720559 | |
imec.availability | Published - open access | |