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dc.contributor.authorNguyen, Van
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSanctorum, Jonathan
dc.contributor.authorVan Wassenbergh, Sam
dc.contributor.authorAerts, Peter
dc.contributor.authorDirckx, Joris J. J.
dc.contributor.authorSijbers, Jan
dc.date.accessioned2021-10-27T14:41:51Z
dc.date.available2021-10-27T14:41:51Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33660
dc.sourceIIOimport
dc.titleA low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system
dc.typeProceedings paper
dc.contributor.imecauthorNguyen, Van
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSanctorum, Jonathan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSanctorum, Jonathan::0000-0001-7968-4705
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage9
dc.source.conference9th Conference on Industrial Computed Tomography - iCT19
dc.source.conferencedate13/02/2019
dc.source.conferencelocationPadova Italy
dc.identifier.urlhttps://www.ndt.net/article/ctc2019/papers/iCT2019_Full_paper_54.pdf
imec.availabilityPublished - open access


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