Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

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Authors

Noltsis, Michalis; Maragkoudaki, Eleni; Rodopoulos, Dimitrios; Catthoor, Francky; Soudris, Dimitrios

ISSN

0167-9260

Journal

Integration, the VLSI Journal

Volume

69

Title

Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

Publication type

Journal article

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