Reliability engineering enabling continued logic for memory device scaling

Thumbnail
Metadata
Show full item record
Authors
O'Sullivan, Barry; Ritzenthaler, Romain; Dentoni Litta, Eugenio; Simoen, Eddy; Machkaoutsan, Vladimir; Fazan, Pierre; Ji, Yunhyuck; Kim, Cheolgyu; Spessot, Alessio; Linten, Dimitri; Horiguchi, Naoto
Conference
2019 IEEE International Integrated Reliability Workshop (IIRW)
Title
Reliability engineering enabling continued logic for memory device scaling
Publication type
Proceedings paper
Collections