Authors

Simicic, Marko; Weckx, Pieter; Parvais, Bertrand; Roussel, Philippe; Kaczer, Ben; Gielen, Georges

ISSN

1063-8210

Issue

3

Journal

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volume

27

Title

Understanding the impact of time-dependent random variability on analog ICs: from single transistor measurements to circuit simulations

Publication type

Journal article