Statistical characterization of BTI and RTN using pMOS arrays

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Authors
Stampfer, Bernhard; Simicic, Marko; Weckx, Pieter; Abbasi, Arash; Kaczer, Ben; Grasser, Tibor; Waltl, Michael
Conference
IEEE International Integrated Reliability Workshop (IIRW)
Title
Statistical characterization of BTI and RTN using pMOS arrays
Publication type
Proceedings paper
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