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Conference contributions
FEOL patterning challenges in scaled SRAM with vertical Surrounding Gate Transistors (SGT)
Publication:
FEOL patterning challenges in scaled SRAM with vertical Surrounding Gate Transistors (SGT)
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Date
2019
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tao, Zheng
;
Li, Waikin
;
Kim, Min-Soo
;
Devriendt, Katia
;
Lorant, Christophe
;
Sebaai, Farid
;
Porret, Clément
;
Rosseel, Erik
;
Sepulveda Marquez, Alfonso
;
Jourdan, Nicolas
;
Kikuchi, Yoshiaki
;
Boemmels, Juergen
;
Mitard, Jerome
;
Matagne, Philippe
;
Ragnarsson, Lars-Ake
;
Dangol, Anish
;
Batuk, Dmitry
;
Martinez Alanis, Gerardo Tadeo
;
Geypen, Jef
;
Altamirano Sanchez, Efrain
;
Lee, James
;
Li, YiSuo
;
Kanazawa, Kenichi
;
Harada, Nozomu
;
Masuoka, Fujio
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2050
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-12
Citations