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A highly reliable 1.4μm pitch via-last TSV module for wafer-to-wafer hybrid bonded 3D-SOC systems
Publication:
A highly reliable 1.4μm pitch via-last TSV module for wafer-to-wafer hybrid bonded 3D-SOC systems
Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Huylenbroeck, Stefaan
;
De Vos, Joeri
;
El-Mekki, Zaid
;
Jamieson, Geraldine
;
Tutunjyan, Nina
;
Muga, Karthik
;
Stucchi, Michele
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
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2059
since deposited on 2021-10-27
Acq. date: 2025-10-27
Citations
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Views
2059
since deposited on 2021-10-27
Acq. date: 2025-10-27
Citations