Publication:

Quantitative 3-D model to explain large single trap charge variability in vertical NAND memory

Date

2019
Proceedings Paper
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Author(s)

Verreck, Devin  
;
Arreghini, Antonio  
;
Bastos, Joao  
;
Schanovsky, Franz
;
Mitterbauer, Ferdinand
;
Kernstock, C.
;
Karner, Markus
;
Degraeve, Robin  
;
Van den Bosch, Geert  
;
Furnemont, Arnaud  

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1921 since deposited on 2021-10-27
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