Authors

Verreck, Devin; Arreghini, Antonio; Bastos, Joao; Schanovsky, Franz; Mitterbauer, Ferdinand; Kernstock, C.; Karner, Markus; Degraeve, Robin; Van den Bosch, Geert; Furnemont, Arnaud

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Quantitative 3-D model to explain large single trap charge variability in vertical NAND memory

Publication type

Proceedings paper

Embargo date

9999-12-31