Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Challenges and approaches in advanced Fin patterning
Publication:
Challenges and approaches in advanced Fin patterning
Date
2019
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Liping
;
Hellin, David
;
Altamirano Sanchez, Efrain
Journal
Abstract
Description
Metrics
Views
2143
since deposited on 2021-10-28
492
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
2143
since deposited on 2021-10-28
492
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations