Publication:

Total-ionizing-dose effects on InGaAs FinFETs with improved gate stack

Date

2019

Proceedings Paper

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Author(s)

Zhao, Simeng E.

;

Bonaldo, Stefano

;

;

;

;

Collaert, Nadine

;

;

Linten, Dimitri

;

Gerardin, Simone

;

Paccagnella, Alessandro

;

Schrimpf, Ronald D.

;

Reed, Robert A.

;

Fleetwood, Daniel M.

Metrics

2065 since deposited on 2021-10-28

Acq. date: 2025-12-09