Authors

Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo

Issue

1

Journal

J. Electrochem. Soc.

Volume

146

Title

Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes

Publication type

Journal article