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Vt extraction methodologies influence process induced Vt variability: Does this fact still hold for advanced technology nodes?
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Authors
Bhoir, Mandar
;
Chiarella, Thomas
;
Mitard, Jerome
;
Horiguchi, Naoto
;
Mohapatra, Nihar
ISSN
0018-9383
Issue
11
Journal
IEEE Transactions on Electron Devices
Volume
67
Title
Vt extraction methodologies influence process induced Vt variability: Does this fact still hold for advanced technology nodes?
Publication type
Journal article
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